The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by ...

Cross-correlation based analysis methods have been developed for electron back scatter diffraction (EBSD) patterns that improve the angular sensitivity to ~10 -4 rads. This enables EBSD to be used to study the much smaller misorientations and even local elastic strain fields that are typical in semiconducting materials. Mapping of the lattice rotations and elastic strain variations provides suf...

The effects of grain boundary character on the intergranular corrosion susceptibility of 2124 aluminum alloy were examined. In the study, the alloy was heat treated at 540oC and corrosion tested according to ASTM G110 standards. After obtaining grain orientations from the automated Electron Back-Scatter Diffraction (EBSD), both grain boundary character and grain boundary plane distributions wer...

Band contrast (BC) is a qualitative measure of electron back-scattered diffraction (EBSD), which is derived from the intensity of the Kikuchi bands. The BC is dependent upon several factors including scanning electron microscope measurement parameters, EBSD camera setup, and the specimen itself (lattice defect and grain orientation). In this study, the effective factors for BC variations and th...

In this study an advanced method for investigation of the microstructure such as electron backscatter diffraction (EBSD) together with in-situ tensile test in a scanning electron microscope (SEM) has been used at room temperature and 300°C. EBSD analyses provide information about crystallographic orientation in the microstructure and dislocation structures caused by deformation. The in-situ ten...

Recent developments in SEM column design have led to the ability to produce nm spot sizes even at high probe currents [1], thus pushing the analytical techniques available in the SEM to conduct microanalysis with nanometer resolution. Although the limitations of microanalysis at these spatial resolution requirements stem from the physics of beam-specimen interaction and the volume from which th...