This paper describes the attributes and goals for a radiation-hard and high-reliability Field Programmable Gate Array (FPGA). The first Qualified Manufacturer List (QML) radiation-hardened antifuse FPGA, RH1280, is characterized. Its total dose and Single Event Effects (SEEs) are tested and the results are reported. Trade-offs and limitations in Single Event Upset (SEU) hardening are also discu...

THE TITLE COMPOUND (SYSTEMATIC NAME 4-{[(2E)-5-hydr-oxy-3,7-dimethylocta-2,6-dien-1-yl]-oxy}-7H-furo[3,2-g][1]benzopyran-7-one), C(21)H(22)O(5), is a known furan-ocoumarin, which was isolated from the Chinese herbal product Radix seu Rhizoma Notopterygii. The crystal structure shows a weak O-H⋯O hydrogen bond.

PROBLEMA 1: Em que situações podemos trocar as posições dos pon-teiros de um relógio (que tem ponteiros das horas e dos minutos) e continuar obtendo uma hora possível? Mostre que essé e um fenômeno periódico e cal-cule seu período.

We report on TID and SEE tests of multi-level and higher density flash memories. Stand-by currents and functionality tests were used to characterize the response of radiation-induced failures. The radiation-induced failures can be categorized as followings: SEU read errors during irradiation, stuck-bit read errors verified post-irradiation, write errors, erase failures, multiple upsets, and sin...

The experimental dependence of the single event upset (SEU) cross-section versus linear energy transfer (LET) function in the nanoscale (with feature size less than 100 nm) memories is explained with the proposed recombination-limited charge yield, which is significantly dependent on LET.

ساختارهای شناختی ابعاد مهمی از ارزیابی­ها در روابط هستند. طرفی ایران خانواده­های همسران، نقش کیفیت زناشویی دارند. تحقیق حاضر به مطالعه بخشی این شناخت­ها یعنی استانداردها منظر والدین ایرانی درباره عروس و داماد مطلوب، با رویکرد پدیدارشناسی تفسیری، پرداخته است. بدین منظور 20 نفر دارای حداقل یک یا داماد، مصاحبه نیمه­ساختار یافته صورت گرفت. میانگین سنی مادران پدران ترتیب 5/57 5/58 سال بود. داده­ها ا...

THIS SUPPLEMENT CONSISTS OF EIGHT SECTIONS. In Section S.1, we illustrate the use of SARSEU through a few simple theoretical exercises. In each case, the exercise is to present a well known alternative to risk-averse SEU and to show that data generated by these theories can violate SARSEU. In Section S.2, we show that, in the 2 × 2 case, SARSEU is equivalent to requirements (5) and (6) in the m...

This work analyzes an effect of single-bit error in configuration memory of FPGA. Several fault models are proposed and described in detail. Software estimation of vulnerable bits from bitstream is presented, in conjunction with the SEU hardware emulator, which experimentally tests a correctness of the estimation. Results of several combinational benchmark are presented and s1488 benchmark disc...

D. C. Nunes, R. J. Phillips, G. Picardi, J. J. Plaut, A. Safaeinili, R. Seu, and A. Egan. Lunar and Planetary Institute, Houston, TX 77058 ([email protected]), Department of Earth and Planetary Sciences and McDonnell Center for the Space Sciences, Washington University, Saint Louis, MO 63130, Infocom Department, “La Sapienza” University of Rome, 00184 Rome, Italy, Jet Propulsion Laboratory, Pa...