نتایج جستجو برای: xrd measurements
تعداد نتایج: 391005 فیلتر نتایج به سال:
X-ray absorption fine structure (XAFS) measurements on a series of epitaxially grown GaN samples have shown a distortion in the microstructure of GaN. More specifically the central N atom is 4-fold coordinated but the four Ga atoms are not equidistant. It has been shown that 2.9 to 3.5 of them (depending on the growth conditions) are found in the expected from XRD distance of 1.94 A and the rem...
A series of Co/Pd multilayers were made by dc magnetron sputter deposition on Al foil substrates. For these multilayered samples, Co layer thicknesses were less than 4 A and Pd layers were varied from 4 to 22 A. Sputtering rates were controlled by either sputtering power (10-50 W) or Ar sputtering pressure (3-15 mTorr). In both cases, lower deposition rates yielded higher perpendicular coercivi...
Al-doped ZnO (AZO) thin films with various Al concentrations were synthesized on Si(001) substrates with native oxide layers by atomic layer deposition process. The effects of the Al concentration on the microstructural characteristics of the AZO thin films grown at 250 degrees C and the correlation between their microstructural characteristics and electrical properties of the AZO thin films we...
Anionic manganese tetrasulfonatophenyl porphyrin (MnTSPP) has been intercalated into the interlamellar space of Mg-Al and Ni-Al layered double hydroxides (LDHs) through the exfoliation/restacking approach by using exfoliated LDH nanosheets and guest molecules as building blocks. The obtained hybrids were characterized by a variety of analytical techniques such as CHN analysis, XRD, FTIR, SEM, H...
Physical, mechanical, and morphological properties of a clay dispersed styrene-co-glycidal methacrylate (ST-co-GMA) impregnated wood polymer nanocomposite (WPNC) were evaluated. The WPNC was characterized by Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM), 3-point bending, free-vibration testing, and Xray diffraction (XRD) measurements. The FT-IR results showe...
We fabricated europium and silver co-doped tantalum-oxide (Ta2O5:Eu, Ag) thin films using a simple co-sputtering method for the first time, and we evaluated their photoluminescence (PL) and X-ray diffraction (XRD) properties. We found that the most remarkable PL peak at a wavelength of 615 nm due to Eu can be enhanced by Ag doping, and the strongest PL peak can be obtained from a Ta2O5:Eu, Ag t...
A series of supramolecular aggregates were prepared using a poly(propylene oxide)-poly(ethylene oxide)-poly(propylene oxide) (PPO-PEO-PPO) block copolymer and β- or α-cyclodextrins (CD). The combination of β-CD and the copolymer yields inclusion complexes (IC) with polypseudorotaxane structures. These are formed by complexation of the PPO blocks with β-CD molecules producing a powder precipitat...
The paper presents preparation of YAG precursor powders mixture with ability for the reaction sintering at lower temperature. The powder mixture was mechanochemically processed and characterized for the specific surface area and crystallinity (XRD). Sintering experiments were performed on the batched powders, mechanochemically processed powders and as-synthesised YAG powders. XRD measurements a...
The effect of fluorine addition on morphological, structural and electrical properties of superconducting samples of composition Y3Ba5Cu8Oy-xFx (x = 0.0, 0.2, 0.4 & 0.6) were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM) and transition temperature (Tc) measurements. The samples were synthesized by solid state reaction method. The XRD of the samples revealed a struc...
ZnO films were prepared on p-Si (111) substrates by using atomic layer deposition. High-resolution x-ray diffraction (XRD), scanning electron microscopy (SEM), x-ray photoelectron spectroscopy (XPS), photoluminescence (PL), and I-V measurements were carried out to characterize structural, electrical, and optical properties. After introducing a 60-nm-thick AlN buffer layer, the growth direction ...
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