With the components of cutting-edge devices becoming smaller and more complicated and their constituent materials becoming more multilayered and diversified, nanometer-order structural control has recently become indispensable. To improve the performance and reliability of manufactured products like these devices, nanometer-order evaluation technology is therefore essential. As examples, this p...

Microstructures of oxide scales thermally formed on single-crystal silicon carbide were investigated using transmission electron microscopy. The oxide scales were formed on the Si-face of 6H-SiC at 1273-1473 K in dry oxygen. Spherical patterns were observed on the surfaces of the oxidized samples by an optical microscope in some regions. In these regions, cross-sectional transmission electron m...

Transmission electron backscattered diffraction, t-EBSD, in the scanning electron microscope, SEM, was initially described in 2010 [1]. After slow initial acceptance, the number of publications in which it is used is increasing markedly. Many of the first applications took advantage of the higher resolution of t-EBSD in the study of thin films [2], [3]. More recently it is being used for pre-sc...

Correlative light/electron microscopy (CLEM) combines the power of light microscopy to search large areas for fluorescently-tagged live cells/regions of interest and transmission electron microscopy (TEM) to image the same specimen at high magnification for ultrastructural characterization. CLEM methods are essential to observe dynamic processes such as organelle biogenesis and intracellular tr...

Single-crystalline SnO2 microcubes were grown using the hydrothermal method without any catalyst. X-ray diffraction (XRD) patterns and energy dispersive X-ray (EDX) analysis verified that the cubes are tin dioxide SnO2. Their morphology and structure was studied by scanning electron microscopy (SEM), transmission electron microscopy (TEM), selected area electron diffraction (SAED), and Raman 5m...