Dispersed particle gel (DPG) has been first successfully prepared using cross-linked gel systems through a simple high speed shearing method with the aid of a colloid mill at room temperature. The gel microstructure and particle size were investigated by scanning electron microscope (SEM), transmission electron microscope (TEM), and dynamic light scattering (DLS) measurements. The results clea...

The novel SiO2 net-like nanobelts have been successfully fabricated on Au-coated Si substrates by a simple thermal evaporation of CdS powder. The as-synthesized SiO2 nanostructures were characterized by using scanning electron microscope (SEM), transmission electron microscope (TEM) and energy dispersive spectroscopy (EDS), respectively. The as-grown SiO2 net-like nanobelts are rather uniformly...

As an imaging system, scanning electron microscope (SEM) performs an important role in autonomous micro-nanomanipulation applications. When it comes to the sub micrometer range and at high scanning speeds, the images produced by the SEM are noisy and need to be evaluated or corrected beforehand. In this article, the quality of images produced by a tungsten gun SEM has been evaluated by quantify...

Three-way scanning electron microscope (SEM) moiré was first generated using a designed three-way electron beam (EB) in an SEM. The spot-type three-way SEM moiré comes from the interference between the three-way EB and the specimen grating in which the periodic cells are arranged in a triangular manner. The deformation and the structure information of the specimen grating in three directions ca...

Electron beam lithography (EBL) is widely used in nanoscale device fabrication and research due to high resolution and excellent flexibility. In this paper, nanometer EBL system based on scanning electron microscope (SEM) is introduced. Its main components include a modified SEM, a laser interferometer controlled stage, a versatile high speed pattern generator, and a fully functional and easyop...

The scanning electron microscope (SEM) is a versatile high-resolution microscopy tool, and perhaps the most widely used imaging platform across many engineering and scientific fields [1]. Within the last decade, another microscopy technique based on a gaseous field ionization source, utilizing Helium and Neon ions has been introduced [2]. While the popularity of the SEM is hardly challenged by ...

Polypropylene/Multiwall carbon nanotubes/Montmorillonite (PP/MWNTs/MMT) hybrid nanocomposites were prepared by using twin-screw extruder incorporating the polypropylene grafted maleic anhydride (PP-g-mA) as compotibilizer is used for better dispersion of nanoclay in the polymer matrix. The effect of MWNTs and MMT on the polypropylene matrix was investigated in terms of mechanical properties of ...

Gas-mediated electron beam induced etching (EBIE) is a nanoscale, direct-write technique analogous to gas-assisted focused ion beam (FIB) milling. The main advantage of EBIE is the elimination of sputtering and ion implantation during processing as well as greater material selectivity [1]. Here we discuss recent developments that expand the scope of EBIE applications in nanofabrication and defe...

– the normal and lateral line cycloid scales of a cyprinid fish capoeta damascina (valenciennes incuvier and valenciennes, 1842) have been subjected to the scanning electron microscopy technique in orderto study their detailed structure. the scales have the general morphological characteristics of the cycloidscales. in the normal scale located below the dorsal fin, the focus lies towards the an...

The focused ion beam (FIB)/scanning electron microscope (SEM) is a scanning microscope with an electron column and an ion column embedded in the same specimen chamber; both beams are aiming at the same point on the specimen surface. The FIB, generated by a Ga Liquid Metal Ion Source (LMIS), impacts the sample normal to the surface and can be focused to a spot as small as few nanometres. The FIB...