In this paper, we present a transient modeling of electromigration (EM) in TSV and TSV-to-wire interfaces in the power delivery network (PDN) of 3D ICs. In particular, we model atomic depletion and accumulation, effective resistance degradation, and full chip-scale PDN lifetime degradation due to EM. Our major focuses are on: (1) timedependent multi-physics EM modeling approach to model TSVs an...

By considering test costs at behavioral level, test problems can be pointed out during the first phases of the design flow. Thus, in case either some testability problems are identified or the size (and hence the cost) of the test set results to be too high, the designer or the high level synthesis tool can modify the circuit to reduce such testability problems. The main problem is the correspo...

According to Broadbent’s (1958) selective filter theory, people do not process unattended stimuli beyond the analysis of basic physical properties. This theory was later rejected based on numerous findings that people identify irrelevant (and supposedly unattended) stimuli. A careful review of this evidence, however, reveals strong reasons to doubt that these irrelevant stimuli were in fact una...

This paper describes the modeling proposal of a middleware for sensor networks in Cyber-Physical (CP) environments adopting the reuse of Designs Patterns, which must favor the coupling in the underlying layers of the middleware and facilitate the communication between components in the upper layers. Our main goal is to reach the robustness and flexibility requirements as a result of the high pr...