in this study, we discuss the capacitated facility location-allocation problem with uncertain parameters in which the uncertainty is characterized by given finite numbers of scenarios. in this model, the objective function minimizes the total expected costs of transportation and opening facilities subject to the robustness constraint. to tackle the problem efficiently and effectively, an effici...

In today’s Integrated Circuits (IC’s) designs Built-in Self Test (BIST) is becoming important for the memory which is the most necessary part of the System on Chip. The March algorithm has been widely used to test memory core of System on chip (SOC). LFSRs and counters are mainly used to generate the memory addresses, which can be serially applied to the memory cores under test. In this paper A...

Chalcogenide based Phase change memory is one type of non-volatile memory that is most likely will replace the currently wide spread flash memory. Current research on Phase Change Memory targets the integration feasibility, as well as the reliability of such memory technology into the currently used CMOS process. Such studies identified special failure modes, known as disturbs, as well as other...