A novel method for the in situ visualization and profilometry of a plasma-facing surface is demonstrated using long-distance microscope. The technique provides valuable monitoring microscopic temporal morphological evolution material subject to plasma–surface interactions, such as ion-induced sputter erosion. Focus variation image stacks enables height profilometry, which allows depth field bey...

The progress on the focused ion beam fabrication method provides us several kinds of advanced techniques for the sample preparation of transmission electron microscopy. With improvement of the beam convergence and the increase of the ion accelerating voltage, the ability of its scanning ion microscope becomes glade up with a good image resolution. The scanning ion microscope is now powerful too...