Surface preparation for advanced materials inspection methods like electron backscatter diffraction (EBSD) generally involve laborious and destructive material sectioning sequential polishing steps, as EBSD is sensitive to both sample topography microstrain within the near-surface. While new methodologies, focussed ion beam femtosecond laser milling are capable of removing in a layer-by-layer m...

Mrk 501 is one of the most prominent TeV-emitting blazars and belongs to class high synchrotron peaked (HSP) blazars. The Doppler factors derived from jet kinematics are much too low provide sufficient beaming for detected high-energy emission (the so-called Lorentz factor crisis). This BL Lac object also a prime example misaligned AGN with an approximately 90∘ difference in orientation between...