Bandgap Reference voltage chip is implemented in 0.25μm CMOS technology with ESD protection. This chip can be designed by using a layout tool micro wind 3.1.7 version. The chip circuit generates a reference voltage of 1.23 V. It can operate between 20oC & 70oC temperature. Band gap core produces a voltage that is insensitive to variation in temperature. It has a unique protection with respect t...

As device dimensions scale down and the operating speed of integrated circuits scales up, electrostatic discharge (ESD) proves an increasingly more critical issue. With hundreds of gigahertz I/O pads in typical data communication circuits, microprocessors, and memories, both the voltage tolerance and the area of ESD protection devices become important design parameters. It is possible to use in...

Electrostatic discharge (ESD) failure is one of the most important causes of reliability problems, therefore the design and optimization of ESD devices have to be done. To achieve very short time to market and reduce the development effort, one tries to make use of the benefit of simulation tools. However, due to the complex physical mechanism of ESD events and the hard mathematic calculation i...

In DC and hybrid microgrids (MG), the DC-bus regulation using Energy Storage Devices (ESD) is important for the stable operation of both the generators and loads. There are multiple commercial voltage levels for both ESD and DC-bus; therefore, the ESD voltage may be higher, equal or lower than the DC-bus voltage depending on the application. Moreover, most of the ESD converter controllers are l...

Electrostatic discharge (ESD) protection devices can have an adverse effect on the performance of high-speed mixedsignal and RF circuits. This paper presents quantitative methodologies to analyze the performance degradation of these circuits due to ESD protection. A detailed s-parameter-based analysis of these high-frequency systems illustrates the utility of the distributed ESD protection sche...

System level Electrostatic Discharges (ESD) can lead to soft-errors (e.g., bit-errors, wrong resets etc.). By this talk we try to offer guidance in finding the root cause of upsets frequently observed in immunity testing (e.g., ESD, EFT). At first a description of the ESD discharge process is given. It provides the necessary background for correctly analyzing ESD failures. Local scanning and in...

Background To systematically evaluate the safety and efficacy of endoscopic submucosal dissection (ESD) versus endoscopic mucosal resection (EMR) for early gastric cancer (EGC). Methods We searched the databases of PubMed, Web of Science, EMBASE, and the Cochrane Library from January 2000 to April 2017 and included studies that compared the outcomes of ESD with EMR for EGC. These eligible stu...