نتایج جستجو برای: atomic force microscopy

تعداد نتایج: 425871  

Journal: :Physical review letters 2003
H J Mamin R Budakian B W Chui D Rugar

We report the detection of the square root of N statistical polarization in a small ensemble of electron spin centers in SiO2 by magnetic resonance force microscopy. A novel detection technique was employed that captures the statistical polarization and cycles it between states that are either locked or antilocked to the effective field in the rotating frame. Using field gradients as high as 5 ...

Journal: :Oil & Gas Science and Technology – Revue d’IFP Energies nouvelles 2021

Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates a reservoir. The discovery wettability alteration in reservoirs, as well complications occur analysis heterogeneous sample, such shale, for instance, have prompted scientists to look the methods assessment at nanoscale. At same time, bulk techniques, which are commonly applied, USBM ...

2009
Maria Torres M. Lourdes Calzada Brian Rodriguez Marin Alexe Lorena Pardo

Ferroelectric PbTiO3 nanostructures have been fabricated using two different procedures that involve microemulsions and Chemical Solution Deposition onto Pt/TiO2/SiO2/(100)Si substrates. The first procedure enables the fabrication of structures with controlled size and shape, as observed by Atomic Force Microscopy (AFM) topography and computer assisted quantitative analysis, while the second pr...

Journal: :Physical review letters 2014
Maximilian Schneiderbauer Matthias Emmrich Alfred J Weymouth Franz J Giessibl

We investigate insulating Cu2N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling microscopy data as proposed by Choi, Ruggiero, and Gupta to unambiguously identify atomic positions. Atomic force microscopy images taken with the two different t...

2012
Delphine Quénet Emilios K. Dimitriadis Yamini Dalal

Atomic force microscopy or scanning tunneling microscopy (AFM/STM) is a powerful single molecule tool for the visualization of biological materials at sub-nanometer resolution. AFM is versatile because it can directly measure physical properties due to its sensitivity at picoNewton force scales, thus enabling dissection of molecular forces. STM/AFM has been considered revolutionary since its di...

2007
m. blomqvist g. bongiorno

We report the structural and tribological characterization of nanostructured CNx thin films produced by the deposition of a supersonic carbon cluster beam assisted by nitrogen ion bombardment. The influence of the deposition parameters on the chemical composition and structure of the films has been systematically studied by X-ray photoelectron spectroscopy, elastic recoil detection analysis, tr...

2014
Mehmet Z Baykara Udo D Schwarz

In order to visualize the atomic structure of materials in real space, a microscope with sub-nanometer resolution is needed. As such, breaking the resolution limit associated with the wavelength of visible light employed in traditional optical microscopy has been a long-standing dream of scientists around the world. This goal was finally reached in the early 1980s with the invention of the scan...

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