In order to develop a new structure microwave probe, the fabrication of AFM probe on the GaAs wafer was studied. A waveguide was introduced by evaporating Au film on the top and bottom surfaces of the GaAs AFM probe. A tip having 7 μm high, 2.0 aspect ratio was formed. The dimensions of the cantilever are 250×30×15 μm. The open structure of the waveguide at the tip of the probe was obtained by ...

In order to develop a new structure microwave probe, the fabrication of AFM probe on the GaAs wafer was studied. A waveguide was introduced by evaporating Au film on the top and bottom surfaces of the GaAs AFM probe. A tip having 7 μm high, 2.0 aspect ratio was formed. The dimensions of the cantilever are 250×30×15 μm. The open structure of the waveguide at the tip of the probe was obtained by ...

Scanning probe instruments have expanded beyond their traditional role as imaging or "reading" tools and are now routinely used for "writing." Although a variety of scanning probe lithography techniques are available, each one imposes different requirements on the types of probes that must be used. Additionally, throughput is a major concern for serial writing techniques, so for a scanning prob...

Multiple single-lever probes for scanning force microscopy arranged in a cassette design and made of a low-stiffness photoplastic material have been developed and successfully tested by imaging DNA molecules. The new concept consists of a column of a one-dimensional array of cantilevers with integrated tips, the first of which is used for imaging and the others are spares in case the first one ...

Articles you may be interested in Adhesive-free colloidal probes for nanoscale force measurements: Production and characterization Rev. Improved in situ spring constant calibration for colloidal probe atomic force microscopy Rev. Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy Rev. A calibration method for lateral forces for use with colloidal probe f...

The PFM is a three-dimensional scanning probe microscope based on optical tweezers. It evolved from AFM techniques by replacing the mechanical cantilever of the AFM with optical tweezers and the cantilever tip by a trapped bead. Various detection systems measure the three-dimensional position of the bead with a spatial and temporal resolution in the nanometer and microsecond range, respectively...

The measurement of the physical properties of surfaces on the nanoscale is a long-standing problem, and the atomic force microscope (AFM) has enabled the investigation of surface energies and mechanical properties over a range of length scales. The ability to measure these properties for softer materials presents a challenge when interpreting data obtained from such measurements, in particular ...

Many interactions drive the adsorption of molecules on surfaces, all of which can result in a measurable change in surface stress. This article compares the contributions of various possible interactions to the overall induced surface stress for cantilever-based sensing applications. The surface stress resulting from adsorption-induced changes in the electronic density of the underlying surface...

The controlled deposition of functional layers is the key to converting nanomechanical cantilevers into chemical or biochemical sensors. Here, we introduce inkjet printing as a rapid and general method to coat cantilever arrays efficiently with various sensor layers. Self-assembled monolayers of alkanethiols were deposited on selected Au-coated cantilevers and rendered them sensitive to ion con...

Surface stress is a material property that underpins many physical processes, such as the formation of self-assembled monolayers and the deposition of metal coatings. Due to its extreme sensitivity, atomic force microscopy ~AFM! has recently emerged as an important tool in the measurement of surface stress. Fundamental to this application is theoretical knowledge of the effects of surface stres...