Mazloum, Jalil

[ 1 ] - Investigation of Effect of Accumulation Layer Thickness of ENZ material on Electro-Absorption Modulator

In this paper, the performance of an optical modulator based on indium tin oxide is investigated at telecommunication wavelength for different accumulation thickness. The plan of metal-oxide-semiconductor is utilized to change the carrier concentration at indium tin oxide-hafnium oxide interface. An optical mode solver based finite element method has been used to calculate the basic parameters ...