Laxmana Maharana
ECE, National Institute of Technology, Agartala
[ 1 ] - Look up Table Based Low Power Analog Circuit Testing
In this paper, a method of low power analog testing is proposed. In spite of having Oscillation Based Built in Self-Test methodology (OBIST), a look up table based (LUT) low power testing approach has been proposed to find out the faulty circuit and also to sort out the particular fault location in the circuit. In this paper an operational amplifier, which is the basic building block in the ana...
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