Mohammed Altaf Ahmed
Eletronic and Communication Engineering, GITAM Institute of Technology, GITAM University
[ 1 ] - Embedded Memory Test Strategies and Repair
The demand of self-testing proportionally increases with memory size in System on Chip (SoC). SoC architecture normally occupies the majority of its area by memories. Due to increase in density of embedded memories, there is a need of self-testing mechanism in SoC design. Therefore, this research study focuses on this problem and introduces a smooth solution for self-testing. In the proposed m...
نویسندگان همکار