کیخسرو خجیر

[ 1 ] - بررسی تاثیر دمای بازپخت در گاف انرژی اکسید تیتانیوم مورد استفاده در حذف آلاینده‌های زیست محیطی ازآب دریا

لایه های نازک تیتانیوم با روش تبخیر به وسیله باریکه الکترونی با ضخامت 70 نانومتر تهیه و سپس در دماهای مختلف K 573-300 در حضور شار ثابت اکسیژن بازپخت شدند. نانو ساختار و جهت های کریستالو گرافی با استفاده از آزمایش پراش پرتو-X تحلیل و خواص اپتیکی نمونه ها با استفاده از دستگاه اسپکتروفوتومتر بررسی شد. با بازپخت نمونه ها نتایج حاصل از XRD شکل گیری جهت کریستالی A(004) مربوط به فازآناتاس دی اکسید ...

[ 2 ] - Sol-gel spin coating derived ZnO thin film to sense the acetic acid vapor

ZnO thin film of 80 nm thickness was deposited by the sol-gel spin coating method on SiO2/Si substrate and subsequently post-annealed at 500°C with a flow of oxygen for 60 min. Crystallographic structure of the sample was characterized by X-ray diffraction (XRD) method while a field emission scanning electron microscope (FESEM) was used to investigate the surface physical morphology ...

[ 3 ] - A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

[ 4 ] - Sol-gel spin coating derived ZnO thin film to sense the acetic acid vapor

ZnO thin film of 80 nm thickness was deposited by the sol-gel spin coating method on SiO2/Si substrate and subsequently post-annealed at 500°C with a flow of oxygen for 60 min. Crystallographic structure of the sample was characterized by X-ray diffraction (XRD) method while a field emission scanning electron microscope (FESEM) was used to investigate the surface physical morphology ...

[ 5 ] - A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...