اردیانیان, مهدی

[ 1 ] - تأثیر ساختار بس لایه بر ساختار و فوتولومینسانس لایه‌های نازک اکسید ژرمانیوم

  Amorphous GeOx/SiO2 multilayers (1<x<2) were prepared by successive evaporation of GeO2 and SiO2 powders onto the Si substrates maintained at 100°C. Structural study by X-ray photoelectron spectroscopy (XPS), Fourier transform infrared-absorption (FTIR) spectrometry, and transmission electron microscopy (TEM) was carried out. These techniques allowed us to follow the structural evolution, and...