Rahebeh Niaraki Asli
Department of Electrical Engineering, University of Guilan, Rasht, Iran.
[ 1 ] - A new low power high reliability flip-flop robust against process variations
Low scaling technology makes a significant reduction in dimension and supply voltage, and lead to new challenges about power consumption such as increasing nodes sensitivity over radiation-induced soft errors in VLSI circuits. In this area, different design methods have been proposed to low power flip-flops and various research studies have been done to reach a suitable hardened flip-flops. In ...
[ 2 ] - MOCA ARM: Analog Reliability Measurement based on Monte Carlo Analysis
Due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. Although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal the quality of analog circuit reliability in the literature, there is a gap to estimate re...
[ 3 ] - A Sub-threshold 9T SRAM Cell with High Write and Read ability with Bit Interleaving Capability
This paper proposes a new sub-threshold low power 9T static random-access memory (SRAM) cell compatible with bit interleaving structure in which the effective sizing adjustment of access transistors in write mode is provided by isolating writing and reading paths. In the proposed cell, we consider a weak inverter to make better write mode operation. Moreover applying boosted word line feature ...
Co-Authors