M. M. Larijani
Nuclear Science and Technology Research Institute, P. O. Box 31485-498, Karaj, Iran.
[ 1 ] - Effect of Thickness on the Structural Properties of Tellurium Film Prepared by Thermal Evaporation
In this research, tellurium (Te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 K. The thickness of the film was determined by Rutherford backscattering spectroscopy. The influence of the thickness on the structural, morphological and molecular bonds was characterized using XRD, scanning electron microscope, and Raman spectroscopy. The XRD...
[ 2 ] - Effect of Cu Content on TiN-Cu Nanocomposite Film Properties: Structural and Hardness Studies
Titanium nitride-Copper (TiN-Cu) nanocomposite films were deposited onto stainless steel substrate using hollow cathode discharge ion plating technique. The influence of Cu content in the range of 2-7 at.% on the microstructure, morphology and mechanical properties of deposited films were investigated. Structural properties of the films were studied by X-ray diffraction pattern. Topography of t...
[ 3 ] - سنتز و مشخصهیابی نانوپودر سوسوزن کادمیم تنگستات بر پایه استات و نیترات و مقایسه ویژگی آنها به عنوان شمارشگر ذرات آلفا
Cadmium tungstate nano powder (CdWO4) was synthesized with co-precipitation method. Two different types of material (based on acetate and nitrate) were used as precursors. The synthesized powder was characterized by X-ray powder diffraction (XRD), scanning electron microscopy (SEM), Fourier transfer Infrared absorption (FTIR) spectrum, and photoluminescent (PL) spectrum. According to the X...
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