M. A. Moghri Moazzen
Young Researchers and Elite Club, Karaj Branch, Islamic Azad University, Karaj, Iran.
[ 1 ] - Effect of Thickness on the Structural Properties of Tellurium Film Prepared by Thermal Evaporation
In this research, tellurium (Te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 K. The thickness of the film was determined by Rutherford backscattering spectroscopy. The influence of the thickness on the structural, morphological and molecular bonds was characterized using XRD, scanning electron microscope, and Raman spectroscopy. The XRD...
[ 2 ] - Synthesis and Characterization of Nano-Sized Hexagonal and Spherical Nanoparticles of Zinc Oxide
ZnO plays an important role in many semiconductors technological aspects. Here, direct precipitation method was employed for the synthesis of nano-sized hexagonal ZnO particles, which is based on chemical reactions between raw materials used in the experiment. ZnO nanoparticles were synthesized by calcinations of the ZnO precursor precipitates at 250 ˚C for 3hours. ...
[ 3 ] - Effect of Thickness on Properties of Copper Thin Films Growth on Glass by DC Planar Magnetron Sputtering
Copper thin films with nano-scale structure have numerous applications in modern technology. In this work, Cu thin films with different thicknesses from 50–220 nm have been deposited on glass substrate by DC magnetron sputtering technique at room temperature in pure Ar gas. The sputtering time was considered in 4, 8, 12 and 16 min, respectively. The thickness effect on the structural, mo...
Co-Authors