mehdi manouchehrian
south Tehran branch, Islamic azad university, Tehran, iran
[ 1 ] - Effect of N2 partial pressure on the structural and mechanical properties of TaN films
TaN films with different N2 partial pressure were deposited on 304 stainless steel using the magnetron sputtering method. The effect of gas pressure on the mechanical property, morphology and phase structure of the films is investigated by X-ray diffraction (XRD), atomic force microscopy (AFM), microhardness testing, friction coefficient measurements, and wear mechanism study. The XRD results c...
[ 2 ] - Effect of Thickness on the Structural Properties of Tellurium Film Prepared by Thermal Evaporation
In this research, tellurium (Te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 K. The thickness of the film was determined by Rutherford backscattering spectroscopy. The influence of the thickness on the structural, morphological and molecular bonds was characterized using XRD, scanning electron microscope, and Raman spectroscopy. The XRD...
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