Optimizing March Algorithm for Testing Embedded Memory: a Case Study
نویسندگان
چکیده
The increase in integrity of the recent VLSI technology has enabled a trend of a lot of new, small and portable applications. The popularity of these portable applications, for ex notebook computers and cellular phones demand even higher performance and lower-power consumption. Embedded semiconductor memories form a big portion of the overall hardware on these portable devices. Testing the semiconductor memories is increasingly important today because of the high density of current memory chips.March algorithms are well known for memory testing because of their simplicity and good fault coverage. This is the reason that they are the dominant test algorithms implemented in most modern memory BIST. The paper describes the proposal to optimize one of the most popular march elements based algorithm c-. The proposed march algorithm is modified march calgorithm which uses concurrent technique. The basic purpose of this proposal is to reduce the complexity of implementation and the test timey. Because of concurrency in testing the sequences the test results were observed in less time than the traditional March tests. This technique is applied for a memory of size 1024x16 and is generic enough to be extended to any other memory size.
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