ASIC Yield Estimation at Early Design Cycle

نویسندگان

  • Von-Kyoung Kim
  • Mick Tegethoff
  • Tom Chen
چکیده

This paper describes an ASIC yield model based on the CMOS bridge fault model. The model predicts defect sensitive area early in the design cycle as a function of number of gates and nets.

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تاریخ انتشار 1996