Introducton to EBIC
ثبت نشده
چکیده
In a semiconductor either electrons or holes typically dominate as dictated by the concentration of ionized dopants, and the nomenclature is n type for electrons dominating and p type for holes. Minority carriers are therefore holes in n type and electrons in p type. Electron-hole pair generation is a local disturbance from the equilibrium concentration. As electron hole pairs are formed, the disturbance has the biggest impact for minority carriers, as the generation density is typically less than the majority carrier density.
منابع مشابه
Depletion region surface effects in electron beam induced current measurements.
Electron beam induced current (EBIC) is a powerful characterization technique which offers the high spatial resolution needed to study polycrystalline solar cells. Current models of EBIC assume that excitations in the p-n junction depletion region result in perfect charge collection efficiency. However we find that in CdTe and Si samples prepared by focused ion beam (FIB) milling, there is a re...
متن کاملEBIC: an artificial intelligence-based parallel biclustering algorithm for pattern discovery
In this paper a novel biclustering algorithm based on artificial intelligence (AI) is introduced. The method called EBIC aims to detect biologically meaningful, order-preserving patterns in complex data. The proposed algorithm is probably the first one capable of discovering with accuracy exceeding 50% multiple complex patterns in real gene expression datasets. It is also one of the very few bi...
متن کاملExtended BIC for small-n-large-P sparse GLM
The small-n-large-P situation has become common in genetics research, medical studies, risk management, and other fields. Feature selection is crucial in these studies yet poses a serious challenge. The traditional criteria such as AIC, BIC, and crossvalidation choose too many features. To overcome the difficulties caused by the small-n-large-P situation, Chen and Chen (2008) developed a family...
متن کاملCore-shell InGaN/GaN nanowire light emitting diodes analyzed by electron beam induced current microscopy and cathodoluminescence mapping.
We report on the electron beam induced current (EBIC) microscopy and cathodoluminescence (CL) characterization correlated with compositional analysis of light emitting diodes based on core/shell InGaN/GaN nanowire arrays. The EBIC mapping of cleaved fully operational devices allows to probe the electrical properties of the active region with a nanoscale resolution. In particular, the electrical...
متن کاملThe Use of Muliiple Ebic Curves and Low Voliage Electron Microscopy in 1he Measuremen1 of Small Diffusion Lengihs
Diffusion length measurements were made in highly doped and radiation damaged III-V semiconductors using the technique of charge collection microscopy (sometimes known as electron beam induced current (EBIC)). EBIC curves were plotted while using the SEM on a llne scan mode. Values of the currents read from these curves were then equated to expressions obtained from the solution of the diffusio...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2015