A neutron diffraction study on the very narrow dynamical width of GaAs [ 200 ]
نویسندگان
چکیده
The energy resolution associated with a particular Bragg reflection is limited by the diffraction properties and by the quality of the material. It can be derived from the structure factor within the dynamic theory of diffraction for ideal crystals. Using the GaAs [200] reflection on a neutron backscattering spectrometer we could realize a resolution of AE=(43±5) neV. This is an improvement by about a factor of 3 as compared to the value calculated for ideal Si [111] and by about a factor of 7 as compared to the best experimental energy resolution available of any crystal spectrometer.
منابع مشابه
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