Soft Computing Approach To Automatic Test Pattern Generation For Sequential Vlsi Circuit
نویسندگان
چکیده
منابع مشابه
Soft Computing Approach To Automatic Test Pattern Generation For Sequential Vlsi Circuit
Due to the constant development in the integrated circuits, the automatic test pattern generation problem become more vital for sequential vlsi circuits in these days. Also testing of integrating circuits and systems has become a difficult problem. In this paper we have discussed the problem of the automatic test sequence generation using particle swarm optimization(PSO) and technique for struc...
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ژورنال
عنوان ژورنال: International Journal of Computer and Communication Technology
سال: 2013
ISSN: 2231-0371,0975-7449
DOI: 10.47893/ijcct.2013.1167