منابع مشابه
Second-harmonic generation in subwavelength graphene waveguides
We suggest a novel approach for generating the second-harmonic radiation in subwavelength graphene waveguides. We demonstrate that the quadratic phase matching between plasmonic guided modes of different symmetries can be achieved in a planar double-layer graphene structure when conductivity of one of the layers becomes spatially modulated. We predict theoretically that, owing to graphene nonlo...
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Daria A. Smirnova,1 Ilya V. Shadrivov,1 Andrey E. Miroshnichenko,1 Alexander I. Smirnov,2,3 and Yuri S. Kivshar1 1Nonlinear Physics Center, Research School of Physics and Engineering, Australian National University, Canberra ACT 0200, Australia 2Lobachevsky State University, Nizhny Novgorod 603950, Russia 3Institute of Applied Physics, Russian Academy of Sciences, Nizhny Novgorod 603950, Russia...
متن کاملSecond-harmonic generation
The goal of this experiment in nonlinear optics is to study the conversion of a (very small) fraction of laser light from its original wavelength of 980 nm (i.e. invisible to the naked eye) to its second-harmonic at a wavelength of 490 nm. This conversion takes place by mild focussing of an intense laser beam in a nonlinear birefringent crystal of BBO (= β BaBO4). You will study the physical pr...
متن کاملPlasmon-assisted high-harmonic generation in graphene
High-harmonic generation in condensed-matter systems is both a source of fundamental insight into quantum electron motion and a promising candidate to realize compact ultraviolet and ultrafast light sources. While graphene is anticipated to efficiently generate high-order harmonics due to its anharmonic charge-carrier dispersion, experiments performed on extended samples using THz illumination ...
متن کاملInterferometric second harmonic generation microscopy.
We describe a novel second harmonic generation (SHG) microscope that employs heterodyne detection by interfering the epi directed SHG from a sample with SHG from a reference crystal. In addition, the microscope provides complementary reflectance information based on optical coherence microscopy (OCM). The instrument features dual balanced detection to minimize the effect of source fluctuations,...
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ژورنال
عنوان ژورنال: JETP Letters
سال: 2011
ISSN: 0021-3640,1090-6487
DOI: 10.1134/s0021364011070046