PO-04-192 RISK FACTORS AND OUTCOMES OF ELECTRICAL STORM AFTER LEFT VENTRICULAR ASSIST DEVICE IMPLANTATION

Electrical storm after Left Ventricular Assist Device (LVAD) is a recognized complication. The risk factors associated with electrical storm, impact on survival less studied. aim of this study to the incidence, LVAD implantation and in patients undergoing LVAD. We performed retrospective cohort all who underwent from January 1, 2001, December 31, 2020, at Mayo Clinic (Rochester, Phoenix, Jacksonville). incidence outcomes (≥3 sustained [>30 seconds] ventricular arrhythmia episodes over 24-hour period) were identified. Among 886 implantation, occurred 61 (7%) median 13 days (interquartile range [IQR] 4.5- 302) post implantation. Thirty-five (57.3%) developed within 30 days, while 26 (42.6%) ES 689 (IQR 228-1171) Pre history arrhythmias (43% vs 25%, p-value=0.002) implantable cardioverter-defibrillator (ICD) shock (34% 22%, p-value=0.024) significantly 1-year mortality rate first occurrence was 38%. Following 7% majority occurring 30-days Risk for included pre-implant ICD shock.