Phase difference analysis technique for parametric faults BIST in CMOS analog circuits
نویسندگان
چکیده
منابع مشابه
Testing for parametric faults in static CMOS circuits
Many defects causing bridges, breaks, and transistor stuck-ons in static CMOS circuits are not detected by tests generated using the traditional single stuck-at fault model. These undetected, non-traditional faults may be detected as increased propagation time or as excessive quiescent power supply current (I DDQ). In this paper we compare the cost of testing for excess I DDQ caused by bridge, ...
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ژورنال
عنوان ژورنال: IEICE Electronics Express
سال: 2018
ISSN: 1349-2543
DOI: 10.1587/elex.15.20180175