Introduction to the Scanning Electron Microscope

the scanning electron microscope

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

The Scanning Confocal Electron Microscope

The Scanning Confocal Electron Microscope, is an instrument which permits the observation and characterization of sub-surface structures of thick, optically opaque materials at nanometer level resolutions. The instrument merges the capabilities of the scanning, transmission and x-ray microscopes, and achieves unprecedented resolutions in optically dense materials, by implementing the technology...

Scanning Electron Microscope A To Z

Since the Scanning Electron Microscope (SEM) was first commercialized about 40 years ago, the SEM has shown a remarkable progress. Now, many types of SEMs are being used, and their performance and functions are greatly different from each other. To utilize these different SEMs, it is essential to recognize their features, as well as to understand the reasons for the contrast of SEM images. Thus...

Forensic Applications of the Scanning Electron Microscope

Automated Scanning Electron Microscope Based Mineral Liberation Analysis An Introduction to JKMRC/FEI Mineral Liberation Analyser

This paper presents the methods and techniques used in the recently developed JKMRC/FEI Mineral Liberation Analyser (MLA). The MLA system consists of a specially developed software package and a standard modern SEM fitted with an energy dispersive spectrum (EDS) analyser. The on-line program of the MLA software package controls the SEM, captures sample images, performs necessary image analysis ...