Image deformation in field ion microscopy of faceted crystals

Best Image Conditions in Field Ion Microscopy

The Field Ion Microscope image quality is dependent on operational ? which can be adjusted in order to improve resolution and contrast, he best image operation conditions are discussed with the aim to define them quantitatively. To do so, a JWKB calculation for the ionization distribution is used and a new interpretation of the best image conditions is proposed. An approximate range for the bes...

Computerized Imaging System for Field Ion Microscopy

Near-field scanning optical microscopy of zinc-porphyrin crystals.

Using a near-field scanning optical microscope (NSOM), crystals of zinc-porphyrin network materials are characterized with respect to morphology and fluorescence. Needle-shaped crystals are observed. While the topography is flat, the fluorescence intensity profile in the width direction is approximately triangular. A numerical calculation shows that differences between the topographic and optic...

Field Ion Microscopy for the Characterization of Scanning Probes

Scanning probe microscopy (SPM) is a widely used tool for investigating the nanoscale structure of materials, as well as their electronic and mechanical properties with its related spectroscopic modes of operation. In SPM experiments, the sharp tip which probes the material under investigation is usually uncharacterized; however, its geometry and chemical composition play a large role in the SP...

Studies of Negative Field Ion Microscopy with Tetracyanoethylene

Negative ion images generated by tetracyanoethylene (TCNE) under inverted field conditions in a field ion microscope have been investigated in more detail. The experiments confirm previous findings / I / and reveal further unique ionization phenomena such as the discontinuous development of ring structures in the ion image, the oscillation of rings in size and switching between different ion em...