Hetero-Interface-Trap Generation due to Hot Carriers in SiGe/Si-Hetero-MOSFETs
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEJ Transactions on Electronics, Information and Systems
سال: 2006
ISSN: 0385-4221,1348-8155
DOI: 10.1541/ieejeiss.126.1101