منابع مشابه
Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development
VLSI chips have been tested using various automatic test equipment (ATE). Although each ATE has a similar structure, the language for ATE is proprietary and it is not easy to convert a test program for use among different ATE vendors. To address this difficulty we propose a tester structure expression language, a tester language with a novel format. The developed language is called the general ...
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ژورنال
عنوان ژورنال: NIPPON SHOKUHIN KOGYO GAKKAISHI
سال: 1993
ISSN: 0029-0394
DOI: 10.3136/nskkk1962.40.447