Design of Capacitor-Less High Reliability LDO Regulator with LVTSCR Based ESD Protection Circuit Using Current Driving Buffer Structure

The peak voltage depending on the load current can be affected by external capacitors installed in output stage of LDO regulator. However, capacitor-less regulator proposed this study was applied a driving buffer structure between error amplifier and path transistor. Therefore, maintained stable regardless controlling an effective overshoot/undershoot voltage. In addition, has built-in LVTSCR based ESD protection circuit. As most IC circuits are malfunctioned destroyed phenomenon, reliability verified through circuit with effectively control result measurement, undershoot 22 mV overshoot 19 were when 250 mA provided under conditions 3.3 V to 4.5 power 3 V. is also guaranteed function at temperatures as high 500 K.