Curve fitting methods for quantitative analysis in electron energy loss spectroscopy
نویسندگان
چکیده
منابع مشابه
Image simulation for electron energy loss spectroscopy.
Aberration correction of the probe forming optics of the scanning transmission electron microscope has allowed the probe-forming aperture to be increased in size, resulting in probes of the order of 1 A in diameter. The next generation of correctors promise even smaller probes. Improved spectrometer optics also offers the possibility of larger electron energy loss spectrometry detectors. The lo...
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Valence electron energy-loss (VEEL) spectroscopy was performed on six ceramic materials in a dedicated scanning transmission electron microscope (STEM). Quantitative analysis of these data is described yielding access to the complex optical properties and the electronic structure of the materials. Comparisons are made on the basis of the interband transition strength describing transitions betw...
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We discuss several ways of using Fourier-ratio deconvolution to process low-loss spectra. They include removal of the tail arising from the zero-loss peak, extraction of the spectrum of a particle from data recorded from the particle on a substrate, separation of the bulk and surface components in spectra recorded from samples of the same composition but different thickness, and investigation o...
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ژورنال
عنوان ژورنال: Microscopy Microanalysis Microstructures
سال: 1990
ISSN: 1154-2799
DOI: 10.1051/mmm:019900010102300